A Novel Five-Transistor SRAM Cell for High Speed and High Density Applications
Abstract
To help overcome limits to the speed and density of conventional SRAMs, we have developed a five-transistor SRAM cell. The newly developed CMOS five-transistor SRAM uses one bit-line during read/write operation. This cell retains its data with leakage current and positive feedback without refresh cycle. The new cell size is 18% smaller than a conventional six-transistor cell using same design rules. Simulation results obtained from HSPICE 2008 in 0.25µm technology show new cell is 27% faster than conventional six-transistor cell. Furthermore, the analytical results are in good agreement with the improvement of speed in new cell.
Keywords
Positive Feedback, Current of Cell, Read Static Noise Margin, Write Operation, Read Operation, Array of Cells